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The guardian of the front-end semiconductor critical dimension quality. The metrology tool can measure the N2 semiconductor process multilayer GAA structure and monitor critical dimensions with atomic-level resolution. Compared with its competitors, the tool has reduced measurement time by 90%. The target market includes foundry and memory below semiconductor N2 node. The market is expected to be USD 130 million in 2025, with an annual growth rate of 36.8%.

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The guardian of the front-end semiconductor critical dimension quality. The metrology tool can measu…

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解决方案&服务内容

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联系方式

联络人:Chun-Ting

电话:

手机:

itriA60470@itri.org.tw

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