The guardian of the front-end semiconductor critical dimension quality. The metrology tool can measure the N2 semiconductor process multilayer GAA structure and monitor critical dimensions with atomic-level resolution. Compared with its competitors, the tool has reduced measurement time by 90%. The target market includes foundry and memory below semiconductor N2 node. The market is expected to be USD 130 million in 2025, with an annual growth rate of 36.8%.
The guardian of the front-end semiconductor critical dimension quality. The metrology tool can measu…more...